Use this url to cite Standard: https://hdl.handle.net/20.500.12512/226492
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
ID
708829
Reference
ISO 16413:2020
Original Reference
ISO 16413:2020
Title
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
Contributor
Lietuvos standartizacijos departamentas
Date Issued
2020-08-14
Technical Committee
ISO Tarptautinė standartizacijos organizacija
Foreign Technical Committee
ISO/TC 201
Subject
| No | Subject |
|---|---|
35.240.70 | IT moksle |
71.040.40 | Cheminė analizė |
Document
| Document | Language | Pages |
|---|---|---|
en | 32 |
Active
Taip / Yes
Date of Submission
2024-02-22