Use this url to cite Standard: https://hdl.handle.net/20.500.12512/206463
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Microbeam analysis -- Scanning electron microscopy -- Vocabulary
ID
661654
Reference
ISO 22493:2014
Original Reference
ISO 22493:2014
Title
Microbeam analysis -- Scanning electron microscopy -- Vocabulary
Contributor
Lietuvos standartizacijos departamentas
Date Issued
2014-04-09
Technical Committee
ISO Tarptautinė standartizacijos organizacija
Foreign Technical Committee
ISO/TC 202/SC 1
Subject
| No | Subject |
|---|---|
37.020 | Optinė įranga |
01.040.37 | Atvaizdavimo technologija (Žodynai) |
Document
| Document | Language | Pages |
|---|---|---|
en | 20 |
Active
Taip / Yes
Date of Submission
2024-02-22